MIDC/AIM Calibration Database
Total Records: 6, displaying 1-6

R#Serial NumberCalibration FacilityCalibration DateDate for next CalibrationResponsivity [45]Calibration Factor [45]Instrument::MakeInstrument::ModelInstrument::DescriptionInstrument::ProgramInstrument::Factory CalibrationInstrument::Date of Factory CalibrationResponsivity Bins [2 deg]Responsivity Function CoefficientsOther CalibrationsCalibration FileContact PersonDocumentation TitleCalibration MethodCalibration NotesOther InformationDatalogger Entry DateResponsivity [45] [Corr]Calibration Factor [45] [Corr]Correction MethodResponsivity Bins Average [2 deg]
1U3140041SRRL/Metrology Lab08/02/200508/02/2007VaisalaHMP45CRHum/Temp TransmitterNREL/ProgramRedaOut of tolerance2 year cycle08/03/2005
2U3140041SRRL/Metrology Lab09/16/201109/16/2012VaisalaHMP45CRHum/Temp TransmitterNREL/ProgramRedadata sheet in optics labCalibrated with CR10X S/N X3597 using keypad readout+3% offset needed for RH09/16/2011
3U3140041SRRL/Metrology Lab10/16/201210/16/2013VaisalaHMP45CRHum/Temp TransmitterNREL/ProgramRedaCalibrated with CR10X S/N X3597 at 25C and 20% +3.3% offset needed for RH10/16/2012
4U3140041SRRL/Metrology Lab04/23/201404/23/2015VaisalaHMP45CRHum/Temp TransmitterNREL/ProgramRedaCalibrated with CR10X S/N X3597 at 24C and 30% +3.3% offset needed for RH10/16/2012
5U3140041SRRL/Metrology Lab05/08/201505/08/2016VaisalaHMP45CRHum/Temp TransmitterNREL/ProgramRedaCalibrated with CR10X S/N X3597 at 22.14C and 30.0% +3.3% offset used for RH (reading 22.1C and 30.1%, left as found)10/16/2012
6U3140041SRRL/Metrology Lab05/18/201605/18/2017VaisalaHMP45CRHum/Temp TransmitterNREL/ProgramA.M. AndreasCalibrated with CR10X S/N X3597 at 23.0C and 30.0% +3.3% offset used for RH (reading 23.0C and 30.0%, left as found)10/16/2012