| R# | Serial Number | Calibration Facility | Calibration Date | Date for next Calibration | Responsivity [45] | Calibration Factor [45] | Instrument::Make | Instrument::Model | Instrument::Description | Instrument::Program | Instrument::Factory Calibration | Instrument::Date of Factory Calibration | Responsivity Bins [2 deg] | Responsivity Function Coefficients | Other Calibrations | Calibration File | Contact Person | Documentation Title | Calibration Method | Calibration Notes | Other Information | Datalogger Entry Date | Responsivity [45] [Corr] | Calibration Factor [45] [Corr] | Correction Method | Responsivity Bins Average [2 deg] |
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| 1 | 25521E6 | SRRL/2002-02 | 06/06/2002 | 06/06/2003 | RS@45=8.0344 µV/W/m² ; +1.39/-1.63% ; N=12 | CF@45=124.46 W/m²/mV | Eppley | NIP | Normal Incidence Pyrheliometer | NREL/Program | 8.05 tg | | [25521E6_Eppley_NIP.2deg.txt] | | | | Tom Stoffel | Borcal 2002-02 | | Valid Zenith angle range for RS@45: 30-60 | Responsivities Revised 10-20-2003 | 04/05/2004 | | | | |
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| 2 | 25521E6 | SRRL/2008-02 | 06/06/2008 | 06/06/2009 | RS@45=7.9760 µV/W/m² ; +1.50/-1.01% ; N=13 ; Z:30-60 | CF@45=125.38 W/m²/mV | Eppley | NIP | Normal Incidence Pyrheliometer | NREL/Program | 8.05 tg | | [25521E6_Eppley_NIP.2deg.txt] | | | | Tom Stoffel | BORCAL 2008-02 Certificates | | | | | n/a ; n/a ; n/a ; Z:n/a | n/a | None ; Estimated thermal offset error = unspecified | |
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