| R# | Serial Number | Calibration Facility | Calibration Date | Date for next Calibration | Responsivity [45] | Calibration Factor [45] | Instrument::Make | Instrument::Model | Instrument::Description | Instrument::Program | Instrument::Factory Calibration | Instrument::Date of Factory Calibration | Responsivity Bins [2 deg] | Responsivity Function Coefficients | Other Calibrations | Calibration File | Contact Person | Documentation Title | Calibration Method | Calibration Notes | Other Information | Datalogger Entry Date | Responsivity [45] [Corr] | Calibration Factor [45] [Corr] | Correction Method | Responsivity Bins Average [2 deg] |
|---|
| 1 | 17830E6 | Eppley | | | 8.21 | | Eppley | NIP | Normal Incidence Pyrheliometer | NREL/Program | 8.21 tg | | | | | | Tom Kirk | | | | | | | | | |
|---|
| 2 | 17830E6 | NREL/96-02 | 07/11/1996 | 07/11/1997 | Rs=8.143 µV/W/m² | | Eppley | NIP | Normal Incidence Pyrheliometer | NREL/Program | 8.21 tg | | | | | | D Clair | Borcal 96-02 | summation | ±2.1% | | | | | | |
|---|
| 3 | 17830E6 | NREL/98-01 | 05/14/1998 | 05/14/1999 | Rs=8.301 µV/W/m² | | Eppley | NIP | Normal Incidence Pyrheliometer | NREL/Program | 8.21 tg | | | | | | Tom Stoffel | Borcal98-01 | | Cf=120.47 W/sqm/mV ±3.8% | | | | | | |
|---|
| 4 | 17830E6 | SRRL/2002 | 01/10/2002 | 01/10/2003 | | | Eppley | NIP | Normal Incidence Pyrheliometer | NREL/Program | 8.21 tg | | | | | | Tom Stoffel | Special-BMS Comparison | | Uncert=±4% | | | | | | |
|---|